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RF Phase Error Built-In-Self-Test for A GSM SOC

Dallas Webster*, Loi Phan**, Oren Eliezer***, Rick Hudgens****, Donald Lie*****

*Department of Electrical and Computer Engg,Texas University,Lubbock,Texas.

**Texas Instruments,Inc,Dallas,Texas.

***Senior Member of Technical Staff,Wireless Terminals Business Unit,Texas Instruments.

****Section Manager,Wireless Terminals Business Unit,Texas Instruments.

*****Associate Professor,Department of Electrical and Computer Engg,Texas University,Lubbock,Texas,USA.

Periodicity:April - June'2008
DOI : https://doi.org/10.26634/jee.1.4.378

Abstract

This paper presents a novel RF Built-in-Self-Test (RF-BiST) targeting to replace the traditionally expensive and time-consuming RF parametric phase error test on a GSM Digital Radio Processor (DRP) radio transceiver. The verification of the RF BiST in a production environment and a comparison of the internal BiST with two alternative external tests is presented, validating the RF BiST as an acceptable test method for determining the phase error of GSM devices. The results illustrate that there are great opportunities in reduction of test time and costs by moving to the internal digital method of the presented BiST for testing RF/analog IC products.

Keywords

All-digital phase-locked loop (ADPLL), built-in self test (BiST), digitally controlled oscillator (DCO), Global System for Mobile communications (GSM), PHase Error (PHE), phase trajectory error (PTE), System-on-Chip (SoC)

How to Cite this Article?

Dallas Webster, Loi Phan , Oren Eliezer , Rick Hudgens and Donald Lie (2008). RF Phase Error Built-In-Self-Test for A GSM SOC. i-manager’s Journal on Electrical Engineering, 1(4), Apr-Jun 2008, Print ISSN 0973-8835, E-ISSN 2230-7176, pp. 39-44. https://doi.org/10.26634/jee.1.4.378

References

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[6]. R.B. Staszewski, I. Bashir, andO. Eliezer, “RF Built-In Self Test of a Wireless Transmitter", IEEE Trans. Circuits and Systems II, 54, No. 2, pp. 186-190, (2007).

[7]. B. Lai, C. Rivera, K. Waheed, “Low Cost Testing of Quadruple Band GSM RFCMOS SoC", International Symposium on VLSI Design, Automation and Test, pp. 1 -4, Hsinchu, Taiwan, (2007).

[8]. 8960 GSM/GPRS/EGPRS Online User's Guide, Agilent 2007,http://wireless.agilent.com/rfcomms/refdocs/gsm/gprs/meas_pfer_desc.php.

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