Low Power SRAM Cell Design with Power Gating Technique

V. Seetha*
Department of Electronics and Communication Engineering, Meenakshi Ramaswamy Engineering College, Ariyalur, Tamil Nadu, India.
Periodicity:January - June'2022
DOI : https://doi.org/10.26634/jcir.10.1.18569

Abstract

The power consumption of Static Random-Access Memory (SRAM) cell is considered as a major factor in modern technologies due to voltage scaling. The existing SRAM cell design of consumes more power at higher frequencies. In the proposed work, power reduction is achieved in various radiation-hardened SRAM cell designs which is based on power gating technique. Hence, the power gated voltage (VDD) design technique is employed to reduce power consumption.

Keywords

SRAM, Power Gating, Low Power Technique, Radiation Hardening by Design (RHBD).

How to Cite this Article?

Seetha, V. (2022). Low Power SRAM Cell Design with Power Gating Technique. i-manager’s Journal on Circuits and Systems, 10(1), 25-34. https://doi.org/10.26634/jcir.10.1.18569

References

[1]. Peng, C., Huang, J., Liu, C., Zhao, Q., Xiao, S., Wu, X., ..., & Zeng, X. (2018). Radiation-hardened 14T SRAM bitcell with speed and power optimized for space application. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 27(2), 407-415. https://doi.org/10.1109/TVLSI.2018.2879341
[2]. Han, Y., Cheng, X., Han, J., & Zeng, X. (2020). Radiation-hardened 0.3–0.9-V voltage-scalable 14T SRAM and peripheral circuit in 28-nm technology for space applications. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 28(4), 1089-1093. https://doi.org/10.1109/TVLSI.2019.2961736
[3]. Atias, L., Teman, A., & Fish, A. (2014). Single event upset mitigation in low power SRAM design. In 2014 IEEE 28th Convention of Electrical & Electronics Engineers in Israel (IEEEI), 1-5. https://doi.org/10.1109/EEEI.2014.7005796
[4]. Gupta, V., & Anis, M. (2010). Statistical design of the 6T SRAM bit cell. IEEE Transactions on Circuits and Systems I: Regular Papers, 57(1), 93-104. https://doi.org/10.1109/TCSI.2009.2016633
[5]. Gavaskar, K., Vidyaa T. E., Suresh S., & Thangaraj N. (2019). Design and comparative analysis of SRAM with performance optimization using MTCMOS technique for high speed computation. International Journal of Computer Applications, 182(36), 1-5. https://doi.org/10.5120/ijca2019918350
[6]. Raghuram, C. N., Gupta, B., & Kaushal, G. (2020). Double node upset tolerant RHBD15T SRAM cell design for space applications. IEEE Transactions on Device and Materials Reliability, 20(1), 181-190. https://doi.org/10.1109/TDMR.2020.2970089
[7]. Kumar, H., & Saun, S. (2019). Power gated technique to improve design metrics of 6T SRAM memory cell for low power applications. ICTACT Journal on Microelectronics, 5(3), 815-819. https://doi.org/10.21917/ijme.2019.0140
[8]. Anandani, D., Kumar, A., & Bhaaskaran, V. K. (2015). Gating techniques for 6T SRAM cell using different modes of FinFET. In 2015 International Conference on Advances in Computing, Communications and Informatics (ICACCI), 483-487. https://doi.org/10.1109/ICACCI.2015.7275655
[9]. Saxena, S., & Mehra, R. (2016). High performance and low power SRAM cell design using power gating technique. International Journal of Electrical and Electronic Engineering and Telecommunications, 5(3), 35-47.
[10]. Guo, J., Xiao, L., & Mao, Z. (2014). Novel low-power and highly reliable radiation hardened memory cell for 65 nm CMOS technology. IEEE Transactions on Circuits and Systems I: Regular Papers, 61(7), 1994-2001. https://doi.org/10.1109/TCSI.2014.2304658
If you have access to this article please login to view the article or kindly login to purchase the article

Purchase Instant Access

Single Article

North Americas,UK,
Middle East,Europe
India Rest of world
USD EUR INR USD-ROW
Online 15 15

Options for accessing this content:
  • If you would like institutional access to this content, please recommend the title to your librarian.
    Library Recommendation Form
  • If you already have i-manager's user account: Login above and proceed to purchase the article.
  • New Users: Please register, then proceed to purchase the article.