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Interfacing of LVDT with AT89S52 Microcontroller for the Development of Precise Instrumentation to Ensure Accurate Measurement across Industry Spectrum

Shweta A. Pote*, Pranali S. Wagh**, Tejaswi K. Pise***, S. C. Pathan****, Prashant V. Mane Deshmukh*****, S. K. Tilekar******

*-****,****** Department of Electronics, Shankarrao Mohite College, Akluj, Maharashtra, India.

***** Department of Electronics, Jayawantrao Sawant College of Commerce and Science, Pune, Maharashtra, India.

Periodicity:July - December'2021
DOI : https://doi.org/10.26634/jes.10.1.18411

Abstract

Industries always highlight the need to choose the tools that provide accurate and precise measurement of data in a way that is best suited to their product. Electronics industry as well, demands the same, as the electrical and electronic components are becoming more and more complex. There is a growing need of sophisticated instrumentation to ensure the precise measurement of physical quantities to meet the quality control processes. The physical quantities such as force, pressure, weight, strain, etc., are vital across the broad range of industries. To meet this objective, an embedded system based on the AT89S52 microcontroller was designed and developed. The displacement transducer LVDT is interfaced to the microcontroller. The signal conditioning stage involves operational amplifier 741. The firmware for the present system is developed in embedded C using Keil μ Vision 4 IDE.

Keywords

LVDT, Microcontroller AT89S52, Keil ? Vision 4, Operational Amplifier 741.

How to Cite this Article?

Pote, S. A., Wagh, P. S., Pise, T. K., Pathan, S. C., Deshmukh, P.V. M., and Tilekar, S. K. (2021). Interfacing of LVDT with AT89S52 Microcontroller for the Development of Precise Instrumentation to Ensure Accurate Measurement across Industry Spectrum. i-manager's Journal on Embedded Systems, 10(1), 24-31. https://doi.org/10.26634/jes.10.1.18411

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Interfacing of LVDT with AT89S52 Microcontroller for the Development of Precise Instrumentation to Ensure Accurate Measurement across Industry Spectrum

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