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X-Ray Analysis of In_xse_1-X Crystals by Scherrer, Williamson-Hall and Size-Strain Plot Methods

P. B. Patel*, H. N. Desai**, Denis***, B. P. Modi****

* Assistant Professor and Head, Department of Physics, J.N.M. Patel Science College, Surat, Gujarat, India.

** Research Scholar, Department of Physics, Veer Narmad South Gujarat University, Surat, Gujarat, India.

*** Associate Professor, Veer Narmad South Gujarat University, Surat, Gujarat, India.

**** Professor, Department of Physics, Veer Narmad South Gujarat University Surat, Gujarat, India.

Periodicity:October - December'2018
DOI : https://doi.org/10.26634/jms.6.3.14725

Abstract

In_xSe_1-x (x=0.2 and x=0.6) crystals have been grown by Bridgman/Stockbarger method. The compositional, morphological and structural properties of In_xSe_1-x semiconductor crystals have been investigated using energy dispersive X-ray (EDX), scanning electron microscopy (SEM) and X-ray diffractometer (XRD) techniques. The freshly cleaved crystals acquired from ingot have mirror-like surface. The powder XRD results revealed that the grown sample was crystalline with a hexagonal structure. SEM image showed that In_xSe_1-x crystals have smooth, homogenous and layered surface. The crystalline developments in the In_xSe_1-x crystals have been investigated by X-ray peak broadening. The Williamson Hall (W-H) analysis and size strain plot methods are used to study the individual contributions of crystallite sizes and lattice strain on the peak broadening of the In_xSe_1-x crystals. The physical parameters such as strain, stress, and energy density values were evaluated more specifically for all the reflection peaks of XRD corresponding to the hexagonal phase of In_xSe_1-x crystals from the modified form of the W-H plot using uniform deformation model (UDM), uniform stress deformation model (USDM), uniform deformation energy density model (UDEDM) and by the size strain plot method (SSP). The results obtained showed that the mean crystallite size of the In_xSe_1-x crystals determined from the W-H analysis and the SSP methods are inter-correlated.

Keywords

Bridgman/Stockbarger Method, Semiconductor Crystals, X-ray Diffractometer Technique, The Williamson Hall (W-H) Analysis, Size Strain Plot Method.

How to Cite this Article?

Patel, P.B., Desai, H. N., Dhimmer, J. M., and Modi, B. P. (2018). X-Ray Analysis of Inxse1-X Crystals by Scherrer, Williamson-Hall and Size-Strain. i-manager’s Journal on Material Science, 6(3), 34-42. https://doi.org/10.26634/jms.6.3.14725

References

[1]. Ates, A., Kundakci, M., Akaltun, Y., Gurbulak, B., & Yildirim, M. (2007). Effective mass calculation for InSe, InSe: Er crystals. Physica E: Low-dimensional Systems and Nanostructures, 36(2), 217-220.

[2]. Bindu P. & Thomas S. (2014). Estimation of lattice strain in ZnO nanoparticles: X-ray peak profile analysis. Journal of Theoretical and Applied Physics, 8(4), 123-134.

[3]. Christy, A. J. (2013). Photocatalytic and antimicrobial investigations of nanoparticles synthesized by combustion method (Unpublished Doctoral Dissertation, Kodaikanal: Mother Teresa Women's University).

[4]. Cullity, B. D. (1956). Elements of X-ray Diffraction. Addison- Wesley Publishing Company Inc., California.

[5]. da Costa, P. G., Dandrea, R. G., Wallis, R. F., & Balkanski, M. (1993). First-principles study of the electronic structure of γ-InSe and β-InSe. Physical Review B, 48(19), 14135.

[6]. Dadras, S., & Davoudiniya, M. (2018). Analysis of YBCO high temperature superconductor doped with silver nano particles and carbon nanotubes using Williamson–Hall and size–strain plot. Physica C: Superconductivity and its Applications, 548, 116-118.

[7]. Emil, E., & Gürmen, S. (2018). Estimation of yttrium oxide microstructural parameters using the Williamson–Hall analysis. Materials Science and Technology, 34(13), 1549-1557.

[8]. Groot, C. D., & Moodera, J. S. (2001). Growth and characterization of a novel In₂Se₃ structure. Journal of Applied Physics, 89(8), 4336-4340.

[9]. Gürbulak, B. (2005). Calculation of the effective mass due to the Influence of an Electric Field on the Optical Absorption in InSe: Er Single Crystal. Chinese Journal of Physics, 43(4), 856-866.

[10]. Hosseinzadeh, L., Baedi, J., & Khorsand Zak, A. (2014). X-ray peak broadening analysis of Fe50Ni50 nanocrystalline alloys prepared under different milling times and BPR using size strain plot (SSP) method. Bulletin of Materials Science, 37(5), 1147-1152.

[11]. Imai, K., Suzuki, K., Haga, T., Hasegawa, Y., & Abe, Y. (1981). Phase diagram of In-Se system and crystal growth of indium monoselenide. Journal of Crystal Growth, 54(3), 501-506.

[12]. Irfan, H., Mohamed Racik, K., & Anand, S. (2018). Microstructural evaluation of CoAl₂O₄ nanoparticles by Williamson–Hall and size–strain plot methods. Journal of Asian Ceramic Societies, 6(1), 54-62.

[13]. Kalita, A., & Kalita, M. P. C., (2017). Williamson-Hall analysis and optical properties of small sized ZnO nanocrystals. Physica E: Low-dimensional Systems and Nanostructures, 92, 36-40.

[14]. Kumar, B. R., & Hymavathi, B. (2017). X-ray peak profile analysis of solid state sintered alumina doped zinc oxide ceramics by Williamson–Hall and size-strain plot methods, Journal of Asian Ceramic Societies. 5(2), 94- 103.

[15]. Mote, V., Purushotam, Y., & Dole, B. (2012). Williamson-Hall analysis in estimation of lattice strain in nanometer-sized ZnO particles. Journal of Theoretical and Applied Physics, 6(6), 1-8.

[16]. Motevalizadeh, L., Heidary, Z., & Abrishami, M. E., (2014). Facile template-free hydrothermal synthesis and microstrain measurement of ZnO nanorods. Bulletin of Materials Science, 37(3), 397-405.

[17]. Patel, P. B., Desai, H. N., Dhimmar, J. M., & Modi, B. P. (2017, May). Growth and characterization of In_0.6 Se_0.4 crystals. In AIP Conference Proceedings (Vol. 1832, No. 1, p. 100007). AIP Publishing.

[18]. Prabhu, Y. T., Rao, K. V., Kumar, V. S. S., & Kumari, B. S. (2014). X-ray analysis by Williamson-Hall and size-strain plot methods of ZnO nanoparticles with fuel variation. World Journal of Nano Science and Engineering, 4(1), 21- 28.

[19]. Raranskii, N. D., Balazyuk, V. N., Kovalyuk, Z. D., Mel'nik, N. I., & Gevik, V. B. (2011). Crystal growth and elastic properties of In₂Se₃. Inorganic Materials, 47(11), 1174-1177.

[20]. Senthilkumar, V., Vickraman, P., Jayachandran, M., Sanjeeviraja, C. (2010). Structural and electrical studies of nano structured Sn_1-xSb_xO₂ (x = 0.0, 1, 2.5, 4.5 and 7 at %) prepared by co-precipitation method. Journal of Materials Science: Materials in Electronics, 21(4), 343- 348.

[21]. Suryanarayana, C., & Norton, M. G. (1998). X-Ray Diffraction–A Practical approach. New York: Plenum Press.

[22]. Ulrich, C., Olguin, D., Cantarero, A., Goni, A. R., Syassen, K., & Chevy, A. (2000). Effect of Pressure on Direct Optical Transitions of γ-InSe. Physica Status Solidi (B), 221(2), 777-787.

[23]. Venkateswarlu, K., Bose, A. C., & Rameshbabu, N. (2010). X-ray peak broadening studies of nanocrystalline hydroxyapatite by Williamson–Hall analysis. Physica B: Condensed Matter, 405(20), 4256-4261.

[24]. Yogamalar, R., Srinivasan, R., Vinu, A., Ariga, K., & Bose, A. C. (2009). X-ray peak broadening analysis in ZnO nanoparticles. Solid State Communications, 149(43-44), 1919-1923.

[25]. Yudasaka, M., Matsuoka, T., & Nakanishi, K. (1987). Indium selenide film formation by the double-source evaporation of indium and selenium. Thin Solid Films, 146(1), 65-73.

[26]. Zak, A. K., Majid, W. A., Abrishami, M. E., & Yousefi, R. (2011). X-ray analysis of ZnO nanoparticles by Williamson–Hall and size–strain plot methods. Solid State Sciences, 13(1), 251-256.

[27]. Zak, A. K., Majid, W. A., Abrishami, M. E., & Yosefi, R. (2012). Facile synthesis and X-ray peak broadening studies of Zn_1-xMg_xO nanoparticles. Ceramics International, 38(3), 2059-2064.

[28]. Zhang, J. M., Zhang, Y., Xu, K. W., & Ji, V. (2006). General compliance transformation relation and applications for anisotropic hexagonal metals. Solid State Communications, 139(3), 87-91.

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X-Ray Analysis of Inxse1-X Crystals by Scherrer, Williamson-Hall and Size-Strain Plot Methods