L) and input transition time (TR). We express setup time model coefficients as a function of logic gate size (Wn) of the latch. We do not use device current/capacitance models in derivation of model, so it is valid with technology scaling. Using proposed model approximately 70% SPICE simulation during the standard cell library characterization for latch setup time can be saved. We observed that setup time calculated using proposed model is within 2% (average) of that calculated using simulation.

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Novel Setup Time Model for Standard Cell Library Characterization

Pravee Jain*, Sharad Mohan Shrivastava**
* PG Scholar, Department of Electronics and Communication Engineering, Sagar Institute of Science and Technology, Bhopal, Madhya Pradesh, India.
** Assistant Professor, Department of Electronics and Communication, Sagar Institute of Science and Technology, Bhopal, Madhya Pradesh, India.
Periodicity:June - August'2018
DOI : https://doi.org/10.26634/jcir.6.3.14566

Abstract

In digital VLSI design calculation of setup/hold time is very important part. Setup/hold time defines the maximum speed of the circuit on which it can work. When a design is completed the first step is to check the timing performances of circuit using Static Timing Analysis (STA) (Scheffer et al., 2006). Accuracy of STA depends on the data described in standard cell libraries. So accuracy of STA depends on accuracy of standard cell library characterization (Cirit, 1991; Roethig, 2003; Patel, 1990; Phelps, 1991). As the technology is scaling down, the characterization of standard cell libraries are becoming more time consuming and requires large computational time. Further due to process, voltage and temperature (PVT) variations standard cell library characterization is done for various PVT, this increase characterization greatly. In this paper we present a novel approach to speed up standard cell library characterization for true single phase clocked (TSPC) latch (Yuan and Svensson, 1989) setup time by developing a linear setup time model. In this model setup time varies linearly with output load capacitance (CL) and input transition time (TR). We express setup time model coefficients as a function of logic gate size (Wn) of the latch. We do not use device current/capacitance models in derivation of model, so it is valid with technology scaling. Using proposed model approximately 70% SPICE simulation during the standard cell library characterization for latch setup time can be saved. We observed that setup time calculated using proposed model is within 2% (average) of that calculated using simulation.

Keywords

Setup time, look up table (LUT), STA, standard cell library characterization, process-voltage-temperature (PVT) variations

How to Cite this Article?

Jain, P., and Shrivastava, S., M. (2018). Novel Setup Time Model for Standard Cell Library Characterization. i-manager’s Journal on Circuits and Systems, 6(3), 9-14. https://doi.org/10.26634/jcir.6.3.14566

References

[1]. Cirit, M. A. (1991). Characterizing a VLSI standard cell library. In Proc. IEEE Custom Integr. Circuits Conf. (pp. 25- 7.1-25-7.4).
[2]. Dasdan, A., Salman, E., Taraporevala, F. P., & Kucukcakar, K. (2009). U.S. Patent No. 7,506,293. Washington, DC: U.S. Patent and Trademark Office.
[3]. Gavrilov, S. V., Gudkova, O. N., & Egorov, Y. B. (2011). Methods of accelerated characterization of VLSI cell libraries with prescribed accuracy control. Russian Microelectronics, 40(7), 476-482.
[4]. Miryala, S., Kaur, B., Anand, B., & Manhas, S. (2011, March). Efficient nanoscale VLSI standard cell library characterization using a novel delay model. In Quality Electronic Design (ISQED), 2011 12th International Symposium on (pp. 1-6). IEEE.
[5]. Patel, D. (1990, May). CHARMS: Characterization and modeling system for accurate delay prediction of ASIC designs. In Custom Integrated Circuits Conference, 1990., Proceedings of the IEEE 1990 (pp. 9-5). IEEE.
[6]. Phelps, R. W. (1991, September). Advanced library characterization for high-performance ASIC. In ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International (pp. P15-3). IEEE.
[7]. Predictive Technology Model. (2011). Retrieved from http://www.eas.asu.edu/ ptm/
[8]. Rabaey, J. M., Chandrakasan, A., & Nikolic, B. (2011). Digital Integrated Circuits, A Design Perspective, 2nd Ed. New Delhi.
[9]. Roethig, W. (2003, September). Library Characterization and Modeling for 130 nm and 90 nm SOC Design. In SOC Conference, 2003. Proceedings. IEEE International [Systems-on-Chip] (pp. 383-386). IEEE.
[10]. Scheffer, L., Lavagno, L., & Martin, G. (2006). EDA for IC Implementation, Circuit Design, and Process Technology. CRC Press.
[11]. Srivastava, S., & Roychowdhury, J. (2008). Independent and interdependent latch setup/hold time characterization via Newton–Raphson solution and Euler curve tracking of state-transition equations. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 27(5), 817-830.
[12]. Sulistyo, J. B., & Ha, D. S. (2002). A new characterization method for delay and power dissipation of standard library cells. VLSI Design, 15(3), 667-678.
[13]. Yuan, J., & Svensson, C. (1989). High-Speed CMOS Circuit Technique. IEEE JSSC, Vol. 24, No. 1.
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