The aspect of lamp expectancy for compact fluorescent lamps (CFL) has already been explored by many lighting engineers. It is also well understood that there several parameters that are always influencing the life and performance of CFLs. The parameter such as lamp current crest factor happens to be a pivotal piece of information in connection with lamp life. It has been observed experimentally that the range of lamp current crest factor should be 1.9 to 2.1 for CFLs. Thus implying a reliable heating of the lamp electrodes without any damage. In most of the high power factor (HPF) lamps it has been observed that the lamp current crest factor is within the prescribed limit. But however if the electrode heating is not sufficient it will result in sputtering of the electrode coating and if it more than sufficient evaporation will occur. In both the cases the lamp electrodes are prone to damage. It has been observed that the lamp starting voltage is an important parameter that governs the necessary and sufficient heating of the lamp electrodes. In this paper explores the impact of high power factor (HPF) circuit on the life of self-ballasted lamps by analyzing the lamp voltage crest factor. The experiment carried out on different types of 18W lamps data for lamp voltage crest factor has been collected. The research work done in this paper provides information about the lamp voltage crest factor with corresponding change in electrode temperature. The lamps used in this paper are put to accelerated test with 5 minutes on and 5 minutes off cycle. The lamps with improved circuit is compared with the other types. The lamp voltage responsible for preheating is finally considered while regulating voltage crest factor using IR215X IC for the lamp ballast. The degradation of lamp life is observed physically. The data is plotted in MATLAB and analyzed. An empirical relation has been derived from the curve fitting tool with the set of results obtained. This work serves an important aspect of HPF circuitry as it explores an ingenious parameter influencing the life of CFLs