i-manager Publications

Fault Detection Methods for Interconnects in ReconfigurableHardware

Pradeep C*, Radhakrishnan R**

* Research Scholar, Anna University, Tamilnadu.

** Professor, SSIET, Tamilnadu.

Periodicity:November - January'2014
DOI : https://doi.org/10.26634/jes.2.4.2803

Abstract

The testing of reconfigurable hardware is performed in logic block and interconnects. There are two methods of testing, application independent and application dependent. Simulation results of detection method for permanent faults and transient faults in interconnects are presented in this paper. This method for permanent fault detection, tests the resources that are utilized by a specific design implemented on Field Programmable Gate Array (FPGA). A possible approach to reduce the number of test configurations will shorten test time with complete coverage and less power consumption which is presented. In the proposed method, an activating input is connected to multiple nets, thus generating a compact set of activating test vectors. This method achieves good fault coverage with reduced number of test configurations. It covers all possible stuck-at and bridging faults in the interconnects.Transient fault detection used in this paper is an application independent method.The proposed methods are useful for building self repairable systems.The simulation is performed using the Xilinx ISE 13.6 and ModelSim 6.6b.

Keywords

Application Dependent Testing, FPGA Testing, Test Configurations, Test Vectors.

How to Cite this Article?

Pradeep.C., and Radhakrishnan.R. (2014).Fault Detection Methods for Interconnects in Reconfigurable Hardware. i-manager’s Journal on Embedded Systems, 2(4), 12-19. https://doi.org/10.26634/jes.2.4.2803

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Fault Detection Methods for Interconnects in ReconfigurableHardware

Abstract

Keywords

How to Cite this Article?

References

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