Disturbance Rejection of Nanopositioner Using Internal Model Control

Sheilza Aggarwal *, Maneesha Garg**, A. Swarup***
* Assistant Professor, Department of Electronics.
** Assistant Professor, Department of Humanities and Applied Science, YMCA University of Science and Technology, India.
*** Professor, Department of Electrical, National Institute of Technology, Kurukshetra, India.
Periodicity:June - August'2012
DOI : https://doi.org/10.26634/jele.2.4.1896

Abstract

Nanopositioning, the precise control and manipulation of devices and materials at nanoscale, plays an important role in all applications of nanotechnology. Nanopositioners are designed to move objects over a small range with a resolution down to a fraction of an atomic diameter.  The primary objectives of nanopositioners include fast response with very little or no overshoot, large travel range, very high resolution, extremely high precision and high bandwidth. Performance characteristics of the system can be improved by the use of feedback controller. Complexity of controller depends upon model of the plant/process and objectives of the control system. The primary objectives of control system are to obtain fast and accurate set point tracking as well as efficient disturbances rejection. The Internal model control (IMC) structure is a suitable control system for satisfying these objectives. This paper presents the identification of nanopositioning device and analyzes its open loop behavior. The IMC scheme is implemented on non-minimum phase nanopositioning devices and is verified for set point changes and disturbance rejection. The proposed control scheme possesses good robustness against set point changes and disturbance rejection. In this paper, performance specifications of nanopositioning system with IMC structure are also compared with traditional PID controller tuning algorithms. Results simulated on MATLAB demonstrate its effectiveness and versatility for precise positioning.

Keywords

Nanotechnology, Nanopositioning, Piezoelectric Actuator, Internal Model Control.

How to Cite this Article?

Sheilza Aggarwal , Maneesha Garg and Akhilesh Swarup (2012). Disturbance Rejection of Nanopositioner Using Internal Model Control. i-manager’s Journal on Electronics Engineering, 2(4), 1-7. https://doi.org/10.26634/jele.2.4.1896

References

[1]. B. Shapiro. (2005). “Workshop on control of micro and nano- scale system” IEEE Control System Magazine, Vol. 25, No. 2, pp 82-88.
[2]. Kourosh kalanter-Zadeh, (2008). Benjamin Fry, “Nanotechnology- Enabled Sensor”, Springer.
[3]. B. Bhushan (2004). “Springer Handbook on nanotechnology” Berlin Germany Springer.
[4]. G. Bining and H. Rohrer, (1986). “Scanning Tunneling Microscope”, Scientific American, Vol.253, pp 50-56.
[5]. K. K Leang, Q. Zou and S. Devasia (2009). “Feedforward Control of Piezoactuators in Atomic Force Microscope System” Asian Journal of Control, Vol 29 No. 1 pp 72-80.
[6]. S.M. Salapaka and M.V. Salapaka (2008). “Scanning Probe Microscope” IEEE Control System Magazine, Vol 28 No. 2, pp 65-83.
[7]. Devasia S. et al. (2007). “IEEE Transaction on Control System Technology”. “A Survey of Control Issues in Nanopositioning” . Vol 15 (5), pp 802-823.
[8]. Thomas R Hicks, Ying Xu, (1997). “The Nanopositioning Book”, Queensgate Instruments ltd.
[9]. A. A Tseng, S. Jou, A. Notargiacomo and T.C. Chen (2008) . “ Recent Development in tip based Nanofabrication and its roadmap” Journal of Nanoscience and Nanotechnology, Vol. 8, pp 2167- 2186.
[10]. B. Potsaid, J.T Wen, M. Unrath, D. watt and M. Alpay, (2007). “High Performance Motion tracking control for electronic manufacturing” Journal of Dynamic System, Measurement and Control, Vol .129, pp 767-776.
[11]. A. Ferreira and C. Mavroidis, (2006). “Virtual Reality and haptics for nanorobotics” IEEE Robot Automation Magazine, Vol. 13 No.3 pp 78-92.
[12]. Huzefa Shakir, Won-Jong kim (2007). “Multiscale control for nanoprecision positioning systems with large throughput ” IEEE Transaction on Control System Technology, Vol 15, No. 5 Sep.
[13]. S. Sebastian and S.M. Salapaka, (2005). “Design methodology for robust nanopositioning” IEEE Transaction on Control System Technology, Vol. 13, No. 6.
[14]. G. schitter, K.J. astrom,B. Demartiny, P.J. Thurner, K.L. turner, (2007). “Design and modeling of high speed AFM scanner” IEEE Transaction on Control System Technology, Vol. 15, No. 5.
[15]. K.K leang and A.J fleming, (2009). “High speed serial- kinematics AFM scanner: design and derive consideration”, Asian Journal of Control, Vol. 11, No.2.
[16]. Timothy Chang and Xuemei Sun, (2006). “Analysis and control of monolithic piezo-electric nano- actuator” IEEE Transaction on Control System Technology, Vol.9, No.1.
[17]. Sheilza jain, Maneesha garg, Akhilesh Swarup, (2011). “Identification and Performance improvement of nanopositioning devices” International Journal of Applied Engineering Research, Vol. 6, No. 5, pp 627-631.
[18]. S.O. Moheimani, (2008). “accurate and fast nanopositioning with piezoelectric tube scanner: Emerging trend and challenges”, Review of Scientific Instruments, Vol. 79, No.7.
[19]. G. schitter and A. stemmer, (2004). “ Identification and open loop tracking control of piezoelectric tube scanner for high speed scanning probe microscopy”, IEEE Transaction on Control System Technology, Vol.12, No. 3.
[20]. Andrew J. Fleming (2010). “Nanopositioning system with force feedback for high performance tracking and vibration control” IEEE Transaction on Mechatronics, Vol 15, No. 3, June.
[21]. D. croft and S. Devasia (2001). “Creep, Hysteresis and vibration compensation for piezoactuators: atomic force miscroscopy application” ASME Journal of Dynamic System and Control, Vol. 123, No. 1 pp 35-42.
[22]. A. Sebastian, S.M. Salapaka, (2005). “Design methodology for robust nanopositioning” IEEE Transaction on Control System Technology, Vol. 13, No. 6 , pp 868-876.
[23]. Qingsong Xu, and Yangmin Li, (2010). “Precise Tracking Control of a Piezoactuated Micropositioning Stage Based on Modified Prandtl-Ishlinskii Hysteresis Model”, 6th Annual IEEE Conference on Automation Science and Engineering, pp 692-697.
[24]. S. Salapaka, A. Sebastian, J.P. Cleveland and M.V. Salapaka (2002). “High Bandwidth nanopositioner: A robust control approach” Review Scientific Instruments, Vol. 73 No. 9, pp 3232-3241.
[25]. Garcia, M. Morari (1982). “Internal model control 1: A unifying Review and some new results”, Industrial Engineering Chemical Process Design and Development. Vol.21, pp 308-323.
[26]. Rivera, Morari and Skogested (1986). “ Internal model control 4 : PID controller design”, Ind. Eng. Chem. Process Design and Dev. 25, pp 252-265.
[27]. Francis B.A., Wonham W. M. (1976). “The internal model principle of control theory” Springer, Automatica, Vol. 12, pp 457-462.
[28]. Seaks R, Murray J. (1981). “Feedback System Design: The tracking and Disturbance Rejection Problem” IEEE Transaction on Automatic Control, Vol 26, pp 203-217.
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