It has been well established that light emitting diode shall invariably replace incandescent lamps and compact fluorescent lamps in smart cities. However one important aspect that needs to be addressed in the context of light emitting diodes and dimming is degradation of Correlated Colour Temperature (CCT). Dimming will alter the temperature at the junction and T-point. Thus any changes in light intensity will finally bring changes in the temperature. Subsequently with changes in T-point temperature CCT also changes. The degradation of CCT will implicate the quality and quantity of light delivered by LED. In LEDs apart from ambient temperature test point or commonly referred as T-point temperature also plays a vital role as it depicts the solder point temperature of the device. In this paper, an attempt has been made to work out a relation between the T-point temperature and CCT. This relation will provide sufficient insight to the manufacturers. Furthermore, the aspect of quality lighting is also required to be dealt in smart lighting. This work primarily offers substantive information regarding the change in CCT with corresponding changes in T-point and ambient temperature.