Effects of Ambient Temperature On Correlated Colour Temperature of Light Emitting Diodes

Aniruddha Mukherjee*, M. K. Gupta**
* Department of Electrical Engineering, Suresh Gyan Vihar University, Jaipur, India.
** Professor, Department of Electrical Engineering, Suresh Gyan vihar University Jaipur, India.
Periodicity:October - December'2017
DOI : https://doi.org/10.26634/jee.11.2.13850


It has been well established that light emitting diode shall invariably replace incandescent lamps and compact fluorescent lamps in smart cities. However one important aspect that needs to be addressed in the context of light emitting diodes and dimming is degradation of Correlated Colour Temperature (CCT). Dimming will alter the temperature at the junction and T-point. Thus any changes in light intensity will finally bring changes in the temperature. Subsequently with changes in T-point temperature CCT also changes. The degradation of CCT will implicate the quality and quantity of light delivered by LED. In LEDs apart from ambient temperature test point or commonly referred as T-point temperature also plays a vital role as it depicts the solder point temperature of the device. In this paper, an attempt has been made to work out a relation between the T-point temperature and CCT. This relation will provide sufficient insight to the manufacturers. Furthermore, the aspect of quality lighting is also required to be dealt in smart lighting. This work primarily offers substantive information regarding the change in CCT with corresponding changes in T-point and ambient temperature.


How to Cite this Article?

Mukherjee, A., and Gupta, M. K. (2017). Effects of Ambient Temperature On Corelated Colour Temperature of Light Emitting Diodes. i-manager’s Journal on Electrical Engineering, 11(2), 1-6. https://doi.org/10.26634/jee.11.2.13850


[1]. Application Note (2006). AN1916, VIPower: Offline constant current LED driver using VIPer 12/22A.
[2]. Chang, M. H., Das, D., Varde, P. V., & Pecht, M. (2012). Light emitting diodes reliability review. Microelectronics Reliability, 52(5), 762-782.
[3]. Chen, C. H., Tsai, W. L., & Tsai, M. Y. (2008, October). Thermal resistance and reliability of low-cost high-power LED packages under WHTOL test. In Electronic Materials and Packaging, 2008. EMAP 2008. International Conference on (pp. 271-276). IEEE.
[4]. Chhajed, S., Xi, Y., Gessmann, T., Xi, J. Q., Shah, J. M., Kim, J. K., & Schubert, E. F. (2005, January). Junction temperature in light-emitting diodes assessed by different methods. In Proc. SPIE (Vol. 5739, pp. 16-24).
[5]. Das, P. (2010). Studies & Development of a High-Flux White LED Based Lighting System having Hand-Driven Charger back-up and also Continuous Monitoring & Controlling of Load (Doctoral dissertation).
[6]. Dyble, M., Narendran, N., Bierman, A., & Klein, T. (2005, September). Impact of dimming white LEDs: chromaticity shifts due to different dimming methods. In Proc. SPIE (Vol. 5941, pp. 291-299).
[7]. Gacio, D., Alonso, J. M., Garcia, J., Campa, L., Crespo, M. J., & Rico-Secades, M. (2012). PWM series dimming for slow-dynamics HPF LED drivers: The highfrequency approach. IEEE Transactions on Industrial Electronics, 59(4), 1717-1727.
[8]. Gacio, D., Alonso, J. M., Garcia, J., Campa, L., Crespo, M., & Rico-Secades, M. (2010, February). High frequency PWM dimming technique for high power factor converters in LED lighting. In Applied Power Electronics Conference and Exposition (APEC), 2010 Twenty-Fifth Annual IEEE (pp. 743-749). IEEE.
[9]. Kressel, H. (1977). JK Bulter Semiconductor asers and heterojunction LEDS. Quantum Electronics, Academic Press.
[10]. Mukherjee, A., & Soni, A. (2016). Effect of Ambient Temperature Rise on the Led Life Time Resource. Light & Engineering, 24(2).
[11]. Narendran, N., Bullough, J. D., Maliyagoda, N., & Bierman, A. (2001). What is useful life for white light LEDs?. Journal of the Illuminating Engineering Society, 30(1), 57- 67.
[12]. Ouendadji, S., Ghemid, S., Meradji, H., & Hassan, F. E. H. (2011). Theoretical study of structural, electronic, and thermal properties of CdS, CdSe and CdTe compounds. Computational Materials Science, 50(4), 1460-1466.
[13]. Trevisanello, L., Meneghini, M., Mura, G., Vanzi, M., Pavesi, M., Meneghesso, G., & Zanoni, E. (2008). Accelerated life test of high brightness light emitting diodes. IEEE Transactions on Device and Materials Reliability, 8(2), 304-311.

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