Testing of Analogue Design Rules Using a Digital Interface

Tom Page*, Gisli Thorsteinsson**
* Lecturer in Electronic Product Design ,Department of Design and Technology , Loughborough University, UK
** Assistant Professor ,Iceland University of Education, Department of Design and Craft Education.
Periodicity:July - September'2008
DOI : https://doi.org/10.26634/jee.2.1.323


This paper considers transient response testing of amended analogue macros in mixed-signal systems.  The stimulus employed for transient response testing is a single logic amplitude pulse which can be propagated through a digital interface scan path.  However, the resulting response must either be readily accessible for processing at a primary output or somewhere routed off-chip.  For a number of reasons this is usually considered impractical.  This paper therefore considers the effects of sampling and quantising transient responses and extracting them through a digital scan path.  The aim of this work is then to define a confidence limit in the accuracy of the test measurements obtained as a function of the number of samples taken, the resolution of the quantifier and the quantiser capture range.


analogue design, mixed signal systems, testing

How to Cite this Article?

Tom Page and Gisli Thorsteinsson (2008). Testing of Analogue Design Rules Using a Digital Interface. i-manager’s Journal on Electrical Engineering, 2(1), Jul-Sep 2008, Print ISSN 0973-8835, E-ISSN 2230-7176, pp. 1-5. https://doi.org/10.26634/jee.2.1.323


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